Brief communication: Weak control of snow avalanche deposit volumes by avalanche path morphology

Computational snow avalanche simulation in forested terrain

Two-dimensional avalanche simulation software operating in three-dimensional terrain is widely used for hazard zoning and engineering to predict runout distances and impact pressures of snow avalanche events. Mountain forests are an effective biological protection measure against avalanches; however, the protective capacity of forests to decelerate or even to stop avalanches that start within f...

Snow Avalanche Admonisher through Wireless Sensor Network

The temperature reaches around -40C to -60C in hilly and mountainous areas during winters which may lead to many probable natural hazards. Defence personnel as well as civilians are unaware of these hazards. Amongst all the natural hazards, Snow Avalanche is one of the major hazards which has the probability of occurrence in the above listed temperature range. The aim of this paper is to bring ...

Snow and avalanche test sites French avalanche research: experimental test sites

This paper contains a short description of the experimental Lautaret site dedicated to avalanche dynamic studies. Since the seventies, many experimental campaigns allowed measuring different avalanche parameters such as velocity, height and pressure. Technical development have been also carried in this site and are presented here. More recently, a chute for physical modelling of avalanche motio...

Automated Avalanche Deposit Mappping from Vhr Optical Imagery

Using eCognition we developed an algorithm to automatically detect and map avalanche deposits in Very High Resolution (VHR) optical remote sensing imagery acquired from satellites and airplanes. The algorithm relies on a cluster-based object-oriented image interpretation approach which employs segmentation and classification methodologies to identify avalanche deposits. The algorithm is capable...

Analysis of weak avalanche multiplication in collector junctions. Avalanche injection measurements on standard transistors like devices